Leeb220
Measuring range (µm): 0~1250μm
Shell: Plastic
Accuracy: ±[(1~3%)H+1] μm H refers to the thickness of testing piece
Minimum resolution (µm):0.1μm
Diameter of the min area (mm): Φ7
Critical thickness of substrate (mm): 0.5
Memory: 200 groups measured data
Dimensions:115×70×30mm
Features
Measuring Materials
Technical Specification
Model | Leeb210 | Leeb211 | Leeb220 | Leeb221 | Leeb222 |
Measuring principle | Fe | NFe | Fe | NFe | Fe & NFe |
Measuring range (µm) | 0~1250μm | ||||
Probe | Settled | Changeable | |||
Shell | Plastic | ||||
Accuracy | ±[(1~3%)H+1] μm H refers to the thickness of testing piece | ||||
Minimum resolution (µm) | 0.1μm | ||||
Min curvature of the min area (mm) | Convex1.5 Concave9 | ||||
Diameter of the min area (mm) | Φ7 | ||||
Critical thickness of substrate (mm) | 0.5 | ||||
Memory | 200 groups measured data | ||||
Dimensions | 115×70×30mm | ||||
Power supply | AAA Alkaline battery |
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